Govt. Exams
Entrance Exams
Transconductance gm = ∂ID/∂VGS = ID/(VGS - VT) at saturation, fundamental small-signal parameter.
Aspect ratio (W/L) is a fundamental design parameter in MOSFETs affecting current capability and switching speed. Higher W/L provides larger current capacity and faster transitions, crucial for circuit optimization and performance tuning.
Early voltage (VA) represents the output resistance (ro = VA/Ic) of a BJT. Larger VA indicates steeper output characteristics, meaning collector current is more independent of collector-emitter voltage, indicating better current source behavior.
Schottky diodes have metal-semiconductor junctions with lower forward voltage (0.3-0.5V vs 0.7V for silicon) and faster switching due to absence of minority carrier storage. This makes them ideal for high-frequency and high-speed switching applications.
RDS_on consists of channel resistance and drift region resistance. For power MOSFETs, drift region (epitaxial layer) dominates. Minimizing drift region thickness reduces RDS_on but decreases breakdown voltage, creating a design trade-off.
CMOS (Complementary MOS) has very low static power dissipation because complementary P and N transistors prevent steady-state current paths. However, dynamic power dissipation increases with switching frequency due to capacitive charging/discharging.
In saturation, both junctions are forward biased. The collector current becomes less than β × Ib because the transistor is no longer in linear region. Excess base current doesn't proportionally increase collector current.
Tunnel diodes show negative differential resistance due to quantum tunneling through the narrow depletion region created by heavy doping. This occurs in forward bias and enables their use as oscillators and amplifiers.