Home Subjects JEE Physics Semiconductors

JEE Physics
Semiconductors

Physics questions for JEE Main — Mechanics, Electrostatics, Optics, Modern Physics.

27 Q 9 Topics Take Mock Test
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Difficulty: All Easy Medium Hard 11–20 of 27
Topics in JEE Physics
Q.11 Hard Semiconductors
The Early voltage (V_A) of a BJT is inversely related to:
A Base width modulation
B Collector doping concentration
C Emitter area
D Temperature
Correct Answer:  A. Base width modulation
EXPLANATION

Early voltage characterizes the output resistance of a BJT. V_A is inversely proportional to the base width modulation effect (Early effect), which becomes significant in short-base transistors.

Test
Q.12 Hard Semiconductors
The Zener voltage of a heavily doped p-n junction is typically lower than that of a lightly doped junction because:
A Lower bandgap energy
B Tunneling dominates over avalanche multiplication
C Increased thermal effects
D Better heat dissipation
Correct Answer:  B. Tunneling dominates over avalanche multiplication
EXPLANATION

Heavy doping narrows the depletion region, allowing quantum tunneling at lower voltages. This shifts breakdown mechanism from avalanche (Zener ~5-6V) to tunneling (~3-4V) in heavily doped junctions.

Test
Q.13 Hard Semiconductors
In a Zener diode, negative resistance occurs in the breakdown region because:
A Avalanche multiplication increases exponentially with voltage
B Current increases while voltage decreases with increasing bias
C Tunnel current increases while ionization current decreases
D Temperature coefficient becomes negative
Correct Answer:  B. Current increases while voltage decreases with increasing bias
EXPLANATION

In Zener breakdown, as the reverse bias increases slightly, the breakdown mechanism (avalanche or tunneling) generates more current, but the voltage across the junction decreases due to voltage regulation.

Test
Q.14 Hard Semiconductors
The Shockley ideal diode equation predicts that reverse saturation current (Is) is proportional to:
A Doping concentration
B exp(VT) where VT is thermal voltage
C Intrinsic carrier concentration squared divided by doping
D Applied reverse voltage
Correct Answer:  C. Intrinsic carrier concentration squared divided by doping
EXPLANATION

Is ∝ ni²/(NA·ND), depending on intrinsic carrier concentration squared and inversely on doping concentrations.

Test
Q.15 Hard Semiconductors
The noise figure of a semiconductor amplifier is lowest when operating at:
A Maximum frequency
B Optimum source impedance
C Minimum supply voltage
D Maximum collector current
Correct Answer:  B. Optimum source impedance
EXPLANATION

Minimum noise figure occurs at optimum source impedance that matches the device's noise characteristics, typically provided in device specifications.

Test
Q.16 Hard Semiconductors
The current gain (β) of a BJT at constant IC depends on:
A Only collector current
B Temperature and base-emitter voltage drop
C Collector voltage only
D Load resistance
Correct Answer:  B. Temperature and base-emitter voltage drop
EXPLANATION

β varies with temperature and VBE changes, following the Ebers-Moll model. Early voltage causes slight VCE dependence.

Test
Q.17 Hard Semiconductors
In a tunnel diode, negative differential resistance occurs because:
A Tunneling current increases with voltage
B Drift current dominates at higher voltages
C Tunneling probability decreases while diffusion current increases
D Majority carrier concentration increases
Correct Answer:  C. Tunneling probability decreases while diffusion current increases
EXPLANATION

In tunnel diode's NDR region, as voltage increases, tunneling current decreases (fewer states to tunnel into) while diffusion current increases, causing net decrease in total current.

Test
Q.18 Hard Semiconductors
Which combination of semiconductor parameters would result in the highest intrinsic carrier concentration at 300K?
A Large Eg and high effective mass
B Small Eg and high density of states
C Large Eg and small density of states
D Negative bandgap energy
Correct Answer:  B. Small Eg and high density of states
EXPLANATION

ni = √(Nc·Nv)·exp(-Eg/2kT) where Nc, Nv depend on effective masses. Small Eg and high density of states both exponentially increase ni. GaAs has higher ni than Si due to smaller Eg.

Test
Q.19 Hard Semiconductors
The specific contact resistance of a metal-semiconductor junction is proportional to:
A exp(φB/kT) where φB is Schottky barrier height
B exp(-φB/kT)
C Directly proportional to doping concentration
D Inversely proportional to bandgap
Correct Answer:  B. exp(-φB/kT)
EXPLANATION

Contact resistance ρc ∝ exp(φB/kT)/Nc where φB is barrier height. Higher barrier leads to exponentially higher resistance following Thermionic emission theory.

Test
Q.20 Hard Semiconductors
In an avalanche photodiode (APD), the internal gain (multiplication factor M) increases significantly due to:
A Increased forward bias voltage
B Impact ionization creating secondary carriers in high electric field region
C Increased bandgap energy
D Decrease in depletion width
Correct Answer:  B. Impact ionization creating secondary carriers in high electric field region
EXPLANATION

APD operates in high reverse bias where impact ionization (collision ionization) produces secondary electron-hole pairs, creating avalanche multiplication and signal amplification internally.

Test
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