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Electronics (ECE)

Analog/digital electronics, communication

135 Q 4 Topics Take Mock Test
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Difficulty: All Easy Medium Hard 121–130 of 135
Topics in Electronics (ECE)
The thermal voltage (VT) at 300K is approximately:
A 25 mV
B 52 mV
C 100 mV
D 200 mV
Correct Answer:  A. 25 mV
EXPLANATION

VT = kT/q where k=1.38×10⁻²³ J/K, T=300K, q=1.6×10⁻¹⁹C gives approximately 26 mV or 25 mV.

Test
A BJT in saturation mode has:
A VCE = 0.2V to 0.3V and both junctions forward biased
B VCE = VCC and reverse biased base-collector junction
C Very low base current and high collector current
D VBE approximately equal to VCE
Correct Answer:  A. VCE = 0.2V to 0.3V and both junctions forward biased
EXPLANATION

In saturation, both BE and BC junctions are forward biased, resulting in VCE dropping to approximately 0.2-0.3V for silicon transistors.

Test
Which of the following is true about intrinsic semiconductors at room temperature?
A Conductivity is zero
B Electron and hole concentrations are equal
C No current flows under any applied voltage
D Fermi level is at the middle of conduction band
Correct Answer:  B. Electron and hole concentrations are equal
EXPLANATION

In intrinsic semiconductors, thermally generated electrons and holes are in equal numbers, making ni = pi at thermal equilibrium.

Test
In a p-n junction diode, the depletion width increases when:
A Reverse bias voltage increases
B Forward bias voltage increases
C Temperature decreases significantly
D Doping concentration increases
Correct Answer:  A. Reverse bias voltage increases
EXPLANATION

Reverse bias widens the depletion region by pulling majority carriers away from the junction, increasing the width of the space charge region.

Test
Which semiconductor material has the lowest bandgap at room temperature?
A Silicon (1.12 eV)
B Gallium arsenide (1.42 eV)
C Germanium (0.66 eV)
D Silicon carbide (3.26 eV)
Correct Answer:  C. Germanium (0.66 eV)
EXPLANATION

Germanium has Eg ≈ 0.66 eV at 300K, lowest among common semiconductors; causes high intrinsic carrier concentration and leakage current.

Test
A light-emitting diode (LED) emits light when:
A Reverse biased beyond breakdown voltage
B Forward biased and minority carriers recombine across the bandgap
C Operated at room temperature
D Connected in parallel with a resistor
Correct Answer:  B. Forward biased and minority carriers recombine across the bandgap
EXPLANATION

Forward bias injects minority carriers; their recombination releases energy as photons (electroluminescence) in direct bandgap semiconductors.

Test
Which of the following statements about Zener diodes is correct?
A They operate in forward bias region for voltage regulation
B They are reverse biased and maintain constant voltage across their terminals
C They have no temperature coefficient of voltage
D They can regulate both positive and negative voltages simultaneously
Correct Answer:  B. They are reverse biased and maintain constant voltage across their terminals
EXPLANATION

Zener diodes operate in reverse breakdown region maintaining nearly constant voltage for voltage regulation applications.

Test
In an n-channel enhancement mode MOSFET, the threshold voltage (VT) is typically:
A Negative
B Zero
C Positive
D Frequency dependent
Correct Answer:  C. Positive
EXPLANATION

N-channel enhancement mode MOSFETs require positive gate voltage to create inversion layer for conduction.

Test
Which of the following devices has the fastest switching speed?
A BJT
B MOSFET
C IGBT
D Thyristor
Correct Answer:  B. MOSFET
EXPLANATION

MOSFETs have fastest switching due to voltage-controlled operation without minority carrier storage effects.

Test
An LED (Light Emitting Diode) emits light when:
A Connected in reverse bias
B Connected in forward bias and sufficient current flows
C Operating at breakdown voltage
D Kept at absolute zero temperature
Correct Answer:  B. Connected in forward bias and sufficient current flows
EXPLANATION

LEDs emit light through electroluminescence when forward biased with sufficient current. The energy of emitted photons equals the bandgap energy of the semiconductor material.

Test
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